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Xtester-High Sensitivity DA Series Dual Probes with Replacement Delay Lines for Ultrasonic Flaw Detection
Features:
| Dual element transducers- These transducers produce improved near-surface resolution when compared with normal single element contact transducers. Used on instruments having isolated pulser/receiver connections(through-trans-mission mode on many instruments), each of the elements functions indepen-dently, one as a transmitter,the other as a receiver. Having a remarkable combination of sensitivity,penetration and resolution,dual element transducers are used in precision thickness gaging applications,and for detection of corrosion,erosion,pits and small internal laminar or elongated flaws. |
Table overview
Model | frequency | Crystal size(mm) | Crystal size(inch) |
DA2.25P7X12 | 2.25Mhz | 7*12mm | equv. 1/4*1/2 inch |
DA5P7X12 | 5Mhz | 7*12mm | equv. 1/4*1/2 inch |
DA2.25P7X24 | 2.25Mhz | 7*24mm | equv. 1/4*1.00 inch |
DA5P7X24 | 5Mhz | 7*24mm | equv. 1/4*1.00 inch |
DA1P7x24 | 1Mhz | 7*24mm | equv. 1/4*1.00 inch |
DA3.5P7x24 | 3.5Mhz | 7*24mm | equv. 1/4*1.00 inch |
DA1P7X12 | 1Mhz | 0.5X0.5 inch | 0.5x1 inch |
DA3.5P7X12 | 3.5Mhz | 0.5X0.5 inch | 0.5x1 inch |
